Product Description
SP Scientific Thermo Jet ES Model THJ80ES10000 – High-Capacity Thermal Test Chamber for Electronics and PCB Testing
This used SP Scientific Thermo Jet ES (THJ80ES10000) is a high-capacity, electrically heated air impingement oven designed for thermal testing of a wide range of electronic components, printed circuit boards (PCBs), and assemblies. It is ideal for applications such as characterizing temperature performance, conducting burn-in tests, and performing thermal shock tests to ensure product reliability .
The system typically features an electrically heated air stream that is precisely controlled and directed to create a localized temperature environment. This design allows for rapid temperature transitions and high throughput. The specific “THJ80” model likely indicates a higher temperature capability and larger chamber volume compared to other models in the Thermo Jet line .
Condition Note: This unit is untested and sold as-is. It is a complex instrument that requires professional installation and calibration. No accessories, such as temperature sensors, airflow nozzles, or power cables, are guaranteed unless specified.
Key Specifications (Typical for Thermo Jet ES Series)
| Specification | Details |
|---|---|
| Manufacturer | SP Scientific / Thermo Jet |
| Model | THJ80ES10000 |
| Part Number | 314153-W |
| Temperature Range | -80°C to +225°C (typical for the ES series) |
| Heating Technology | Electric Heating |
| Airflow | 5–10 CFM (nominal) |
| Voltage | 208/240 VAC, 3-Phase (required) |
| Typical Application | Thermal cycling, burn-in, and reliability testing of electronic components |
| Condition | Used – Untested |
Applications
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Semiconductor Testing: Characterizing the thermal performance of ICs, GPUs, and microprocessors.
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PCB Testing: Subjecting assembled circuit boards to temperature extremes to detect faults.
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Burn-In: Operating electronic devices at high temperatures to accelerate early-life failures.
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Reliability Engineering: Performing temperature cycling, thermal shock, and HALT (Highly Accelerated Life Testing) tests.
