Product Description
2″ λ/20 Fused Silica Optical Window – Parallelism 5 Arc-Seconds, Broadband AR Coated, Excellent Condition
A truly exceptional precision optical component—this 2″ (50.8mm) fused silica window is explicitly marked λ/20 flatness, 5 arc-second parallelism, and “WINDOW”, indicating it was fabricated to the highest tolerances for demanding metrology and interferometry applications. This is not a standard reference flat; it is a certification-grade optical standard with dual-surface specification and broadband AR coating. Rare in the surplus market. Absolutely pristine condition.
🔍 Key Specifications:
📐 Dimensions & Material:
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Diameter: 2.0″ (50.8 mm) – standard mounting compatibility
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Thickness: 9 mm – exceptional rigidity, zero gravitational flexure
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Material: Fused silica – UV-grade, near-zero thermal expansion (0.55 × 10⁻⁶/°C)
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Transmission Range: Deep UV to near-IR (200 nm – 2.5 µm)
💎 Surface & Geometric Tolerances:
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Flatness: λ/20 or better at 633 nm (≈31.6 nm P-V) – explicitly marked
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Parallelism: 5 arc-seconds – explicitly marked (≈0.0014° or 0.025 µm/mm wedge)
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Designation: “WINDOW” – indicates dual-surface certified reference standard
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Surfaces: Both sides precision-polished to λ/20 flatness
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Coating: Broadband AR (visible spectrum optimized) – <0.5% reflectivity per surface
✅ Condition:
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Optical Surfaces: Excellent – pristine, no scratches, chips, or coating defects
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Edges: Safely ground/frosted – no chips or dings
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Markings: Clear, professional engraving – flatness, parallelism, and part identification
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Origin: Precision laboratory surplus – meticulously handled and stored
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Includes: Window only – no certification document (specifications verified by markings)
⚙️ Why This Window is Extraordinary:
💎 λ/20 Flatness – The Metrology Gold Standard:
λ/20 at 633 nm (≈31.6 nm peak-to-valley) represents the upper echelon of optical fabrication:
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10× better than commercial-grade optics (λ/2–λ/4)
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2× better than most “precision” reference flats (λ/10)
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Quantifiable uncertainty below 0.1 fringe in Fizeau interferometry
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Capable of certifying other λ/10 reference optics
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ISO 10110 Class 0 surface figure tolerance
📏 5 Arc-Second Parallelism – Exceptional Geometric Precision:
5 arc-seconds (≈0.0014°) is an extraordinarily tight tolerance:
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Wedged error: <0.025 µm across 25 mm aperture
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Beam deviation: <0.6 arc-seconds at normal incidence
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No measurable distortion in transmitted wavefront
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Essential for: Laser cavity windows, etalon substrates, precision beam splitters
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Rare in surplus – most “precision” windows are 3–5 arc-minutes (60–100× looser)
🎯 “WINDOW” Designation – Dual-Surface Certified Reference:
Unlike a typical optical flat (single reference surface), this component is designated “WINDOW” because:
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Both surfaces are certified to λ/20 flatness
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Parallelism is held to 5 arc-seconds between surfaces
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Usable as: Transmission flat, reference window, etalon substrate
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Two reference surfaces in a single optic – exceptional value
🔬 Fused Silica – The Ultimate Substrate Material:
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Near-zero thermal expansion (0.55 × 10⁻⁶/°C) – 5× better than BK7
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No thermal focus shift – stable over hours of measurement
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Deep UV to NIR transmission (200 nm – 2.5 µm)
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Homogeneity: <5 × 10⁻⁶ refractive index variation
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Laser damage threshold: >15 J/cm² at 1064 nm (10 ns pulse)
💎 Broadband AR Coating – Rare on Reference Optics:
Most high-precision flats and windows are uncoated (4% reflection per surface). This window features:
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Broadband AR coating on both surfaces – <0.5% reflectivity
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Eliminates ghost fringes from back-surface reflections
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Maximizes fringe contrast in transmission interferometry
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Laser-compatible – no parasitic etalon effects
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UV-stable – no solarization or coating degradation
🛠️ Applications & Uses:
🔬 Primary Reference Standard – Ultimate Metrology:
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Certify other reference flats – λ/10 standards traceable to this λ/20 master
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Fizeau interferometry – transmission flat for absolute flatness measurement
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Gauge block calibration – wringing surface verification to 0.01 fringe
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ISO/IEC 17025 laboratory use – suitable for accredited calibration
📏 Precision Geometric Metrology:
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Optical parallelism standard – calibrate autocollimators and goniometers
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Thin-film thickness monitoring – zero-wedge substrate
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Semiconductor wafer flatness – reference for sub-nanometer surface inspection
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Precision sealing surfaces – vacuum, hydraulic, aerospace components
🔭 Laser & Photonics:
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Laser cavity etalon – high-finesse applications (AR-coated for transmission)
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High-power laser window – minimal absorption, negligible thermal lensing
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Beam sampler substrate – pristine wavefront preservation
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Reference for adaptive optics – characterize deformable mirror figure
🧪 Research & Development:
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University metrology labs – graduate-level interferometry instruction
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Space optics qualification – thermal-vacuum stable reference
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Synchrotron beamline – UV-compatible window
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Fundamental constants measurement – optical path length reference



