Wilton Network Analyzer Universal Test Fixture 3680K
This is an untested used item taken from a working environment.
Designed for precision measurement of microwave substrates, the Anritsu 3680 UTF enables accurate, repeatable transitions between coaxial connectors and on-substrate microstrip or CPW devices.
⚙️ Key Features
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Frequency Coverage:
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Model 3680‑20: DC to 20 GHz via 3.5 mm connector
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Model 3680K: DC to 40 GHz using K-connector
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Model 3680V: DC to 60 GHz via V-connector
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Universal Adjustability:
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Accommodates substrates up to 2 in (50 mm) long without additional center sections
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Spring-loaded jaws ensure consistent electrical contact on substrates from 5 mil to 75 mil thickness
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Dielectric spacers minimize fringing capacitance for superior repeatability (±0.1 dB)
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Flexible Test Configurations:
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Supports offset line testing up to ±0.5 in (±2.5 cm) (±1 in / 2.5 cm for 3680‑20) for inline or parallel circuit measurement
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Right-angle launcher accessory enables multi-port and 90° test setups with high fidelity
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Bias probe attachment (Model 36803) for injecting power or holding components directly on the substrate
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MMIC attachment (Model 36802) for testing miniature, uncarried substrates with precise spring tab contact
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Calibration & Verification:
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Compatible with Open‑Short‑Load (OSL) or Line‑Reflect‑Line (LRL) kits for both microstrip and CPW substrates
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Verification kits include Beatty standards and offset terminations to confirm calibration integrity in-situ
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📐 Dimensions & Specs
| Parameter | 3680‑20 | 3680K / 3680V |
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| Overall Size (W × L × H) | ≈ 4.9 × 7 × 2.5 in | ≈ 4 × 5 × 2.5 in |
| Substrate Length Range | 0.2 in–4.0 in (5 mm–10 cm) | 0.2 in–2.0 in (5 mm–5 cm) |
| Max Line Offset | ±1.0 in (25 mm) | ±0.5 in (12.7 mm) |
| Substrate Thickness Range | 0.005 in–0.075 in (0.12–1.9 mm) | – |
🎯 Applications & Advantages
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Compatible with both Vector and Scalar over coax VNAs for automated or manual measurements
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Eliminates need for custom fixtures across different substrate formats, reducing setup time
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Maintains ±0.1 dB repeatability, critical for accurate characterization across GHz frequencies
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Modular add-ons (right-angle, bias, MMIC) support a wide variety of DUT geometries and test scenarios









