Product Description
Veeco / Digital Instruments Dimension 5000 Atomic Force Microscope (AFM) with Acoustic Enclosure
This used Veeco (Digital Instruments) Dimension 5000 is a high-performance Atomic Force Microscope (AFM) system designed for advanced nanoscale imaging and metrology. This configuration includes an acoustic enclosure to isolate the instrument from environmental noise and improve measurement stability .
The Dimension 5000 is a flagship system from the Dimension series, widely used in academic, industrial, and government research labs for semiconductor, polymer, biomaterial, and data storage applications . It features a large motorized stage for scanning samples up to 8 inches (200mm) in diameter and 12mm thick, making it ideal for wafer-scale characterization .
The system offers a maximum plane scan range of 80 x 80 µm (upgradeable to 90 x 90 µm with a Hybrid XYZ head) and a Z-range of ~6 µm . It supports multiple imaging modes including TappingMode™, Contact Mode, Phase Imaging, Magnetic Force Microscopy (MFM), and Electrical Force Microscopy (EFM) .
Key Specifications
| Specification | Details |
|---|---|
| Manufacturer | Veeco / Digital Instruments (now Bruker) |
| Model | Dimension 5000 |
| Scan Range (XY) | 80 x 80 µm (standard); 90 x 90 µm (with Hybrid XYZ head) |
| Scan Range (Z) | ~6 µm; up to 8 µm (Hybrid) |
| Lateral Resolution (XY) | ~1.5 nm |
| Z Resolution | < 0.1 nm |
| Max Sample Size | 200 mm x 200 mm, thickness < 12 mm |
| Stage Travel | Motorized: 200 x 250 mm (XY) |
| Imaging Modes | Tapping, Contact, Phase, MFM, EFM, LFM, STM, and more |
| Controller | Nanoscope IIIa |
| Enclosure Type | Acoustic enclosure (reduces acoustic noise, blocks EMI) |
| Condition | Used – Untested |
Key Features & Benefits
| Feature | Benefit |
|---|---|
| Acoustic Enclosure | Reduces acoustic and electromagnetic noise, improving image quality |
| Large Sample Handling | Accommodates 8″ wafers and large specimens |
| 80 x 80 µm Scan Range | Versatile for both high-resolution and large-area imaging |
| Multiple Imaging Modes | Comprehensive sample analysis capability |
| Integrated Optical Microscope | CCD camera for precise tip positioning |
| Motorized Stage | Enables automated, large-scale scanning |
| Nanoscope IIIa Controller | Industry-standard controller |
| Proven Research Platform | Used in thousands of publications worldwide |
Applications
-
Semiconductor Metrology: Wafer surface roughness, step height, defect analysis
-
Materials Science: Polymer morphology, thin films, composites
-
Data Storage: Magnetic media characterization (MFM)
-
Biomaterials: Imaging biological structures
-
Nanolithography & Nanofabrication: Patterning and manipulation at the nanoscale
-
Failure Analysis: High-resolution imaging for quality control
Why This Works for Research & Metrology Professionals
| Feature | Benefit |
|---|---|
| Veeco/Digital Instruments Quality | Trusted brand in AFM technology |
| Large Sample Capacity | 8″ wafer capability for semiconductor research |
| Acoustic Enclosure Included | Environmental isolation for improved image quality |
| Proven Research Platform | Widely used in academic and industrial labs |
| Multiple Imaging Modes | Versatile for various applications |
| Legacy Value | Cost-effective way to acquire a high-end AFM system |
