Rucker & Kolls 130 wafer probe

Product Description

Rucker & Kolls Model 130 Manual Wafer Probe Station with Zeiss Microscope Stage (Vintage Semiconductor Test Equipment)

This is a vintage Rucker & Kolls Model 130 manual wafer probe station, a classic instrument used for electrical testing of semiconductor wafers and integrated circuits. This unit includes a Zeiss microscope and precision mechanical stage for probe alignment and sample positioning. A piece of semiconductor history, it is sold AS IS for parts, restoration, or display.

Key Components:

• Probe Station Base: Heavy, vibration-damped base with X-Y-Z coarse and fine positioners for the chuck (wafer holder)

• Probe Arms: Two or more manual probe arms with micrometer-driven manipulators for positioning tungsten or exotic metal probe needles

• Microscope: Zeiss stereomicroscope on a boom stand, likely with brightfield/darkfield illumination

• Stage: Precision mechanical stage for sample manipulation under the microscope

• Chuck: Vacuum or mechanical chuck for holding wafers or dies (may be missing inserts)

• Era: 1970s–1980s, from the early era of semiconductor R&D and production

Potential Uses:

• Historical Restoration: For museums, private collectors, or companies preserving semiconductor heritage.

• Component Salvage: High-quality Zeiss optics, precision micrometer stages, manipulators, and vibration-damping components.

• Functional Restoration Project: For a specialized lab or enthusiast willing to restore a classic probe station to working order.

• Educational Display: Demonstrates early semiconductor testing technology for engineering or physics programs.

Important Notes:

• Not a Turn-Key System: This is a manual, non-automated probe station from a pre-automation era.

• Microscope Compatibility: The Zeiss microscope may need servicing; optics should be inspected for haze or fungus.

• Mechanical Wear: All moving parts (micrometers, stages, bearings) may require cleaning and re-lubrication.