Quesant Q400

The Quesant Q400 is a high-performance Atomic Force Microscope (AFM) designed for nanometer-scale imaging, topographical analysis, and material characterization. This AFM system provides exceptional resolution, stability, and versatility, making it ideal for scientific research, semiconductor analysis, and industrial applications.

Key Features & Benefits:

✔ High-Resolution Imaging:

• Capable of nanometer and sub-nanometer resolution.

• Ideal for surface morphology, roughness analysis, and material studies.

✔ Advanced Scanning Technology:

• Utilizes precision piezoelectric scanning for accurate measurements.

• Supports multiple imaging modes including contact, tapping, and non-contact AFM.

✔ Versatile Applications:

• Compatible with a wide range of sample types, including biological, polymer, and semiconductor materials.

• Provides high-quality 3D surface profiling for research and development.

✔ User-Friendly Software & Controls:

• Integrated with intuitive software for data acquisition and analysis.

• Allows for automated scanning, image processing, and measurement tools.

✔ Robust and Stable Design:

• Built with vibration isolation to ensure high-precision measurements.

• Optimized for long-term stability in research environments.

Applications:

• Nanotechnology & Materials Science – Characterization of nanostructures and thin films.

• Semiconductor Research – Surface roughness and defect analysis.

• Biological & Life Sciences – Imaging of cells, proteins, and biomaterials.

• Industrial & Quality Control – Precision surface metrology for manufacturing.

Why Choose the Quesant Q400?

• Proven AFM performance for high-precision imaging.

• Flexible and versatile for multiple research applications.

• Reliable and easy-to-use system for consistent, high-resolution data.