Product Description
Leitz 567 039 PL Fluotar 32x/0.75 Metallurgical Microscope Objective (Finite 160mm Tube Length)
This is a high-performance Leitz PL Fluotar 32x/0.75 metallurgical objective, part number 567 039. Designed for reflected light applications such as metallography, materials science, and epifluorescence, this objective delivers exceptional contrast, resolution, and flatness of field—hallmarks of Leitz’s premium Fluotar optical series. Compatible with Leitz microscopes using a 160mm finite tube length and RMS thread.
Key Specifications:
-
Magnification: 32x
-
Numerical Aperture (NA): 0.75 (high resolution, excellent light gathering)
-
Optical Design: PL Fluotar – Plan-corrected for flat field, Fluorite-grade glass for high transmission and low autofluorescence
-
Mechanical Tube Length: Finite 160mm (for older Leitz/Leica DM R, Metalloplan, Orthoplan, etc.)
-
Thread: RMS (Royal Microscopical Society standard)
-
Working Distance: Short (typical for high-NA metallurgical objectives; exact distance varies)
-
Correction: Corrected for no cover glass (0.17mm cover glass not used in reflected light)
-
Application: Reflected light brightfield, darkfield, DIC, and epifluorescence
Why This Objective Is a Premium Choice:
-
Fluotar Optics: Superior to standard achromats, offering better color correction, higher transmission (ideal for fluorescence), and a flatter field.
-
High NA (0.75): Provides excellent resolution and light collection for detailed imaging of metals, ceramics, semiconductors, and other opaque samples.
-
Leitz Legacy: Part of the renowned Leitz/Leica quality lineage, sought after for research and industrial inspection.
Compatibility Note:
This objective is designed for finite 160mm tube length microscopes. It is not compatible with infinity-corrected systems (common in newer microscopes). Verify your microscope’s tube length before purchasing.
Applications:
-
Metallurgical Sample Analysis: Grain structure, inclusion analysis, failure analysis.
-
Materials Science: Imaging ceramics, composites, polished geological samples.
-
Semiconductor/PCB Inspection: Defect review, layer alignment checks.
-
Fluorescence Microscopy: Suitable for blue/green fluorophores due to high transmission.



