Product Description
HP 11602B Transistor Fixture – For S-Parameter Measurements, DC to 2 GHz
This used HP 11602B is a precision transistor test fixture designed for S-parameter measurements from DC to 2 GHz in a 50-ohm coaxial circuit . It is specifically engineered to mount directly on the front panel of the HP 8745A S-Parameter Test Set, providing a complete solution for characterizing bipolar and field-effect transistors .
The fixture accepts transistors with TO-5 to TO-12 package dimensions, as well as any three or four-lead package with leads that lie on a 0.2-inch circle and have diameters of 0.016 to 0.019 inches . It can also be used to measure other circuit elements such as diodes, resistors, or inductors with appropriate lead dimensions .
Key Specifications
| Specification | Details |
|---|---|
| Manufacturer | Hewlett-Packard (HP) / Agilent / Keysight |
| Model | 11602B |
| Type | Transistor test fixture |
| Frequency Range | DC to 2.0 GHz |
| Impedance | 50 ohms coaxial circuit |
| Compatible Packages | TO-5 to TO-12 package dimensions |
| Lead Circle Diameter | 0.2 inch (accepts leads on this circle) |
| Lead Diameter Range | 0.016 to 0.019 inches |
| Device Types | Bipolar transistors, FETs, diodes, resistors, inductors |
| Compatibility | Mounts on HP 8745A S-Parameter Test Set |
| Connections | Provides common emitter/base/collector and common source/gate/drain connections |
Features & Benefits
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Precision S-Parameter Measurements: Designed specifically for accurate device characterization in a 50-ohm environment
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Wide Package Compatibility: Accepts TO-5 through TO-12 packages, covering a broad range of through-hole transistors
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Flexible Device Support: Not limited to transistors—can measure diodes, resistors, and inductors with suitable leads
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Integrated Biasing: Provides bias connections for both bipolar transistors and FETs
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Direct Mounting: Attaches directly to the HP 8745A test set for a complete measurement system
Applications
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RF Transistor Characterization: S-parameter measurements for modeling and design
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Semiconductor Device Testing: Evaluating bipolar and field-effect transistors
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Component Evaluation: Measuring diodes, resistors, and inductors
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Quality Assurance: Verifying device performance against specifications
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Research and Development: Characterizing new or custom devices
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Education: Teaching RF measurement techniques
Condition
SOLD AS IS
USED – SHOWS NORMAL LAB WEAR (scuffs, minor marks)
RF PERFORMANCE NOT VERIFIED
NO HP 8745A TEST SET INCLUDED (fixture only)
NO TRANSISTORS OR DEVICES INCLUDED
PICTURE MAY NOT MATCH PRODUCT
⚠ MEASUREMENT NOTE: This fixture is designed to be used with the HP 8745A S-Parameter Test Set and compatible network analyzer for complete device characterization .



