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The MCW (Multi-Contact Wedge) series by GGB Industries offers flexible probe bodies that enable either DC or power delivery to circuits during testing, including non-planar surfaces.
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These probes are especially useful when you need multiple contact points delivered simultaneously—often at very fine pitch—without damaging delicate structures.
- A type of multi-signal, High-frequency probe used in testing microchips and electronic components.
- Provides reliable, low-resistance contacts for probing non-planar structures on chips or modules, often used in conjunction with wafer probers.
- The tips are individually spring-loaded and made of Beryllium-Copper ensuring reliable contact
- For more information visit ggb.info
There are multiple varieties
MCW-22-8593-A (2) SN30971, 30972
MCW-22-8593-C SN31165
MCW-22=8593-D SN 31166
MCW-22-8593-E SN 31167
MCW-22-8593-F SN 31168













