Product Description
Precision Fused Silica Beamsplitter Plate – Dual-Band 632.8nm (Rmax) / 514.5nm (Tmax), Tw ≤ 0.050 Waves at 45° Incidence
This is a high-performance, custom-engineered dual-wavelength beamsplitter fabricated from UV-grade fused silica. Designed for precise beam management in multi-line laser systems, it features fully documented spectral performance, elite wavefront tolerance, and clear orientation markings—making it a rare and valuable surplus optic for advanced laser applications.
Key Specifications (As Marked):
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Diameter: ~75 mm
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Thickness: ~10 mm
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Material: UV-grade fused silica (low thermal expansion, high laser damage threshold)
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Spectral Performance at 45° AOI:
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Rmax at 632.8 nm (HeNe alignment beam – highly reflected)
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Tmax at 514.5 nm (Argon-ion green line – efficiently transmitted)
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Wavefront Error: Transmitted wavefront (Tw) ≤ 0.050 waves (exceptional optical precision)
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Coating: Dielectric beamsplitter coating; AR coating on one side (arrow-marked “AR”)
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Orientation: Edge marked “theta=45 degree” and arrow pointing to AR-coated side
Condition:
✅ EXCELLENT LAB SURPLUS – Pristine optical surfaces, no scratches or coating defects
✅ FULLY CHARACTERIZED – All performance parameters etched on edge
Why This Beamsplitter Is Exceptional:
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Dual-Wavelength Optimization: Precisely engineered to separate 632.8 nm (HeNe) and 514.5 nm (Argon) laser lines—critical for multi-line laser system design.
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Elite Wavefront Tolerance: Tw ≤ 0.050 waves ensures minimal distortion in transmitted beam, making it suitable for interferometry and precision alignment.
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Clear Orientation Guidance: Arrow marking eliminates guesswork; orient AR-coated side toward the source for optimal performance.
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Substantial Cost Savings: New custom equivalents from premium manufacturers exceed $800–$1,200.
Applications:
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Argon-Ion/HeNe Laser Systems: Separate the green 514.5 nm process beam from the red 632.8 nm alignment beam at 45° incidence.
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Precision Interferometry: Reference beamsplitter in Michelson or Mach-Zehnder setups requiring low wavefront error.
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Multi-Wavelength Beam Combining/Splitting: For advanced photonics research, spectroscopy, or laser printing/imaging systems.
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University & Industrial R&D: Ideal for labs developing or maintaining dual-wavelength laser architectures.
Installation Note:
For specified performance, mount at 45° angle of incidence (AOI) with the AR-coated side (arrow-marked) facing the incoming beam.



