Rigaku Nanohunter II Benchtop Total XRF Spectrometer

Description

Product Overview:

The Rigaku Nanohunter II is a high-performance benchtop total X-ray fluorescence (XRF) spectrometer designed to provide rapid, non-destructive elemental analysis with unparalleled sensitivity. Ideal for research, quality control, and environmental testing, the Nanohunter II allows for the accurate detection and quantification of elements in solids, liquids, and powders. Its compact design, ease of use, and low maintenance make it a versatile choice for laboratories and industrial applications where fast, reliable results are essential.

This system is equipped with cutting-edge X-ray optics and a highly sensitive detector, enabling it to analyze a broad range of materials from trace elements to heavier elements with ease. Its precision and speed make it suitable for a wide variety of applications, including materials science, environmental analysis, and industrial manufacturing.

Key Specifications:

• Excitation Source: Low power X-ray tube, offering excellent sensitivity while maintaining energy efficiency.
• Detector Type: Silicon Drift Detector (SDD), providing high resolution for accurate and fast elemental analysis.
• Energy Range: 0.5 to 40 keV, capable of detecting a wide range of elements, from light to heavy metals.
• Sample Types: Solids, liquids, and powders, making it highly versatile for different industries and research areas.
• Analysis Time: Typically < 60 seconds per sample, ensuring rapid analysis for high-throughput environments.
• Software: Advanced Rigaku software package with intuitive controls, real-time data analysis, and reporting.
• Size: Compact benchtop model, designed to fit into space-constrained laboratories while offering full analytical capabilities.
• Cooling: Air-cooled system that reduces maintenance requirements and operating costs.
• Power Supply: 100-240 V, allowing for easy integration into various laboratory environments.

Key Features:

• High Sensitivity & Precision: The Rigaku Nanohunter II’s advanced detector provides high sensitivity, ensuring low detection limits and high accuracy for trace element analysis.
• Fast Analysis: With typical analysis times under 60 seconds, it delivers quick results, making it ideal for high-throughput testing in quality control and research laboratories.
• Versatile Sample Handling: The spectrometer accommodates a wide range of sample types, including solids, liquids, and powders, making it versatile across a variety of industries such as materials science, mining, and environmental monitoring.
• Ease of Use: Equipped with Rigaku’s user-friendly software interface, the Nanohunter II simplifies calibration, data analysis, and report generation, enabling even novice users to perform complex analyses.
• Compact & Space-Efficient: Its benchtop design allows for installation in labs with limited space while still delivering the power and precision of larger, more cumbersome systems.
• Non-Destructive Analysis: The Nanohunter II provides non-destructive analysis, preserving the integrity of the sample, which is particularly important for valuable or rare materials.

Applications:

• Materials Science: Ideal for analyzing metal alloys, polymers, and ceramics, the Nanohunter II helps ensure material composition is consistent for manufacturing and R&D purposes.
• Environmental Monitoring: It’s used for the analysis of environmental samples, such as soil, water, and air filters, to monitor trace contaminants and pollutants.
• Mining & Geology: The spectrometer is ideal for elemental analysis of geological samples, providing insights into the composition of minerals and ores.
• Quality Control in Manufacturing: Widely used in industries like electronics, automotive, and construction for ensuring product quality and regulatory compliance.
• Forensic & Archaeological Analysis: Non-destructive analysis makes it useful for examining archaeological artifacts and forensic samples without damaging them.

Conclusion:

The Rigaku Nanohunter II Benchtop Total XRF Spectrometer is an essential tool for professionals who require fast, accurate, and reliable elemental analysis. Its advanced detection capabilities, user-friendly software, and versatility make it an invaluable asset for a range of industries, from materials science to environmental monitoring. With its compact size, low maintenance, and high performance, it is the perfect solution for laboratories that demand high-quality results.

As per the manufacturer:

Benchtop TXRF for ultra-trace analysis
GI-XRF capability for thin film characterization
Quantify to parts-per-billion (ppb) levels
600 W X-ray tube for fast measurements
Silicon drift detector (SDD)
16 position autosampler
High sensitivity for As, Se and Cd
Perfect for nano-particle analysis

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