Keithley 60101-VCM Module (Lot of 2)

This unit was removed from a working environment but unable to be tested.

The 60101-VCM (voltage control module) is a module used with Keithley’s S600 series parametric test system, serving as one of several interchangeable components in that system

Discontinued System: The S600 line has been officially discontinued since 2009.

As such, new units are no longer manufactured, and value is largely driven by scarcity and niche demand.

Engineered for precision semiconductor device evaluation, this module provides highly stable voltage sourcing and measurement capabilities to support high-throughput wafer-level testing in analog, mixed-signal, and BiCMOS IC production environments.

As part of the modular S600 architecture, the 60101-VCM works in conjunction with Source-Measure Units (SMUs), high-voltage interfaces, and RF options to create a flexible, scalable test platform. Its design ensures accurate low-noise operation across a broad voltage range, enabling reliable characterization of device parameters from the development lab to volume manufacturing.

Key Features:

• Purpose-built voltage control for semiconductor parametric testing.

• Seamless integration with S600 Series systems for parallel device testing.

• Low-noise performance for precise and repeatable measurements.

• Supports advanced test automation via Keithley Test Environment (KTE) software.

• Rugged, serviceable module for extended system lifecycle.

Applications:

• Wafer-level device characterization.

• Process monitoring and yield optimization.

• Parametric testing of analog, digital, and mixed-signal ICs.

The Keithley 60101-VCM is ideal for semiconductor fabs, R&D labs, and failure analysis facilities that require dependable, high-accuracy voltage control within a proven test system architecture.