HEWLETT PACKARD 4145B SEMICONDUCTOR PARAMETER ANALYZER

HEWLETT PACKARD 4145B SEMICONDUCTOR PARAMETER ANALYZER. No manual or other accessories. As shown.

 

Product Overview:

The Hewlett Packard 4145B Semiconductor Parameter Analyzer is a high-precision automated test system engineered for the accurate characterization of semiconductor devices. Designed to perform detailed current-voltage (I-V) and capacitance-voltage (C-V) measurements, the 4145B is ideal for R&D, production testing, and quality assurance in the semiconductor industry. Its versatile measurement capabilities and robust design make it a trusted instrument for analyzing device performance, reliability, and failure mechanisms.

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Key Specifications:

• Measurement Capabilities:
  • I-V Characterization: Measures from nanoampere to ampere levels
  • C-V Analysis: Suitable for a wide range of semiconductor devices
• Voltage Range: Up to 100 V (typical)
• Dynamic Range: High dynamic range for low-noise, high-resolution measurements
• Interfaces:
  • GPIB for remote control and data logging
  • Multiple communication ports for automation
• User Interface: Integrated digital display and control panel for easy setup and operation
• Calibration: Supports internal and external calibration for consistent accuracy

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Key Features:

• High-Precision Measurement:
  • Provides precise and repeatable I-V and C-V data critical for semiconductor device characterization.
• Wide Dynamic Range:
  • Accommodates a broad spectrum of device parameters from low to high currents and voltages.
• Automation & Remote Control:
  • GPIB compatibility enables integration into automated test systems for high-throughput applications.
• Versatile Test Functions:
  • Suitable for wafer-level and packaged device testing, making it adaptable to various semiconductor manufacturing processes.
• Robust and Reliable:
  • Built with high-quality components to deliver consistent performance in both laboratory and production environments.

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Applications:

• Semiconductor Device Characterization:
  • Evaluating I-V and C-V properties of transistors, diodes, and integrated circuits.
• Quality Control:
  • Ensuring device performance meets strict manufacturing standards.
• Research & Development:
  • Supporting advanced materials research and new semiconductor technology development.
• Failure Analysis:
  • Investigating device degradation and failure mechanisms in electronic components.

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What’s Included:

• 1 x Hewlett Packard 4145B Semiconductor Parameter Analyzer
• Power Cable
• User Manual
• Calibration Accessories (if applicable)

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Why Choose the HP 4145B?

The HP 4145B Semiconductor Parameter Analyzer combines exceptional measurement precision with robust automation capabilities, making it an indispensable tool for engineers and researchers. Its wide dynamic range and reliable performance ensure that critical semiconductor parameters are measured accurately, supporting innovation and quality in semiconductor device development.

No manual or other accessories. As shown.