Exicor 150AT Birefringence Measurement System

Description

Exicor 150AT Birefringence Measurement System – High-Precision Optical Stress Analysis

The Exicor 150AT by Hinds Instruments is a high-performance birefringence measurement system designed for precision optical stress analysis in materials and components. Utilizing proprietary Photoelastic Modulator (PEM) technology, the system delivers subnanometer resolution, fast mapping speeds, and repeatable results for both R&D and quality control environments.

Key Features:

• Model: Exicor 150AT

• Manufacturer: Hinds Instruments

• Measurement Type: Birefringence and retardation mapping

• Technology: Patented PEM (Photoelastic Modulator)

• Retardation Range: 0.005 – 300+ nm

• Retardation Resolution / Repeatability: 0.001 nm / ±0.015 nm

• Angular Resolution / Repeatability: 0.01° / ±0.07°

• Light Source: HeNe Laser (632.8 nm standard); other wavelengths optional

• Sample Size Support: Up to 150 mm x 150 mm (larger optional)

• XY Stage: Automated for fast, programmable measurements

• Data Output: 2D and 3D mapping, numerical analysis

• Applications: Ideal for glass, optics, photolithography components, fused silica, crystals, and more

• Software: Intuitive interface with advanced visualization and export functions

• Design: Tabletop unit with no moving parts in optical path

Common Applications:

• Optical component quality control

• Stress and birefringence mapping in glass and polymers

• Inspection of photomasks and laser optics

• R&D for stress-induced optical changes

• Semiconductor and display manufacturing