Dimension 5000 Atomic Force Microscope

Description

Digital Instruments Dimension 5000 Atomic Force Microscope (AFM) with Micro-g Vibration Isolation Table

The Digital Instruments Dimension 5000 is a high-resolution atomic force microscope (AFM) engineered for precise nanoscale surface characterization. Ideal for research laboratories and academic institutions, it combines exceptional resolution with versatile measurement capabilities. This unit includes a Micro-g vibration isolation system, essential for maintaining stability and accuracy during atomic-scale measurements.

Key Features:

• Model: Dimension 5000

• Manufacturer: Digital Instruments / Veeco

• System Type: Atomic Force Microscope (AFM)

• Imaging Modes: Contact, Tapping, and Non-contact modes

• Integrated Controller: Includes NS4 or Nanoscope IV controller (verify per unit)

• Stage Size: Accommodates standard sample sizes with high-precision scanning

• Scan Range: Typically 100 µm x 100 µm lateral, 5–10 µm vertical

• Resolution: Sub-nanometer Z resolution

• Software Compatibility: Nanoscope software (Windows-based interface)

Micro-g Vibration Isolation System Included:

• Type: Passive vibration isolation platform

• Size: Designed to support the AFM frame

• Performance: Eliminates floor and environmental vibrations critical for atomic-scale imaging

• Construction: Pneumatic isolators with reinforced steel frame

Applications:

• Nanotechnology R&D

• Semiconductor inspection

• Biological and polymer surface analysis

• Surface roughness and topology mapping

• Thin film characterization